Techniques for Nano-mechanics Measurement using Atomic Force Microscopy

Abstract

Controlling domain structure, filler network and their boundary in nanometer and micrometer scale is necessary for development of new generation materials. Not only visualizing their morphology, also quantifying mechanical properties is important for understanding of relationship between molecular structure and bulk properties. This article provides an overview of some techniques for measuring mechanical properties using atomic force microscopy/scanning probe microscopy. Cantilever-based indentation can be used to obtain elastic modulus by assuming contact mechanics. Conventional phase imaging in tapping mode provides information about loss tangent. A bimodal AM-FM technique has advantages for fast and high-resolution imaging of elastic and dissipative properties.