総説
X線散乱の基礎と新展開
キーワード:
X-ray Scattering,
Hierarchical Structure,
Wide-angle X-ray Scattering,
Small-angle X-ray Scattering
2019 年 92 巻 2 号 p. 57-62
詳細
2019 年 92 巻 2 号 p. 57-62
X-ray Scattering technique is a powerful method to analyze the structures of soft-materials in the order of 0.1 nm to 1,000 nm. Here we present the basics of X-ray scattering and how we can apply this method to the rubber systems including complex hierarchical structures.
