hamon
Online ISSN : 1884-636X
Print ISSN : 1349-046X
ISSN-L : 1349-046X
Advanced Electron Beam Techniques
Yoshihiko HirotsuYoichi Yoshida
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2007 Volume 17 Issue 1 Pages 75-80

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Abstract
After 100 years from the time of discovery of electron, we now have many applications of electron beam in science and technology. In this report, we review two important applications of electron beam: electron microscopy and pulsed-electron beam. Advanced electron microscopy techniques to investigate atomic and electronic structures, and pulsed-electron beam for investigating time-resolved structural change are described.
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© The Japanese Society for Neutron Science
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