研究
核融合研究における半導体検出器の利用
1984 年 10 巻 2-3 号 p. 133-141
詳細
1984 年 10 巻 2-3 号 p. 133-141
Applications of semiconductor detectors for diagnostics of high temperature plasma are described. The present status of Si(Li) soft X-ray spectrometers for measuring plasma electron temperature and of imaging instruments using an array of silicon surface-barrier detectors(SSBD's) is reviewed. Another application of SSBD's for measuring plasma ion temperature based on the spectroscopy of plasma particles(H, D, He, etc.) is presented. Finally, a short discussion is made on some limitations of semiconductor detectors for applying to fusion plasma diagnostics.
