特集 「極微量元素分析法」
共鳴イオン化法による超微量元素分析
1990 年 16 巻 2 号 p. 51-65
詳細
1990 年 16 巻 2 号 p. 51-65
Recent development of trace element analysis by resonance ionization technique is reviewed. Two or three visible/UV laser radiations resonantly and selectively ionize free atoms of target element. Feasibility of counting a small number of atoms is discussed.
