Annealing Effect on the Chemical Composition of a Synchrotron Radiation Irradiated Polytetrafluoroethylene (PTFE) Surface by the X-ray Photoelectron Spectroscopy

Abstract

The chemical composition and components of a synchrotron radiation (SR) irradiated polytetrafluoroethylene (PTFE) surface were investigated as a function of the annealing temperature by the X-ray photoelectron spectroscopy (XPS). When the annealing temperature of SR irradiated PTFE was less than 150 °C, almost no change was observed in XPS spectra. With increasing the annealing temperature at more than 200 °C, the relative intensity of the F 1s peak to the C 1s peak increased gradually. In addition, the intensity of the CF₂ component also increased. These results indicate that the chemical composition and components of the SR irradiated PTFE surfaces are restored by annealing. Based on the XPS spectra, the annealing effect on the chemical composition and components is discussed.