IEEJ Transactions on Electronics, Information and Systems
Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221
<Electronic Materials and Devices>
NEXAFS Analysis of Mg Nanoparticles Oxidized in Atmosphere
Satoshi OgawaHironori NiwaKouji NakanishiToshiaki OhtaShinya Yagi
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2010 Volume 130 Issue 10 Pages 1746-1750

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Abstract
The Mg nanoparticles have been fabricated by the gas evaporation method under the several He gas pressures. We have estimated the size of Mg nanoparticles by atomic force microscopy (AFM) observation and have studied the chemical state of Mg nanoparticles exposed to atmosphere by near-edge X-ray absorption fine structure (NEXAFS) technique. The average diameters of Mg nanoparticles fabricated under 3, 5 and 10 kPa of He are 3.6, 8.0 and 5.0 nm, respectively. It is found that the degree of atmospheric oxidation of Mg nanopaticles depends on the size of nanoparticles.
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© 2010 by the Institute of Electrical Engineers of Japan
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