A Study of Zero-Reflection Conditions in the ATR to Measure Optical Constants of Metal or Low Refractive Index Dielectric Films

The transactions of the Institute of Electrical Engineers of Japan.C

Online ISSN : 1348-8155
Print ISSN : 0385-4221

A Study of Zero-Reflection Conditions in the ATR to Measure Optical Constants of Metal or Low Refractive Index Dielectric Films

Hiroe Kitajima, Katsuhiko Hieda, Yasuharu Suematsu

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1981 Volume 101 Issue 8 Pages 193-199

DOI https://doi.org/10.11526/ieejeiss1972.101.193

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