IEEJ Transactions on Electronics, Information and Systems
Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221
“Failure detection of MOS-FETs in RF MOS-FET power amplifier of SEPP type”
Kazuhisa Hayeiwa, Hiroaki Ikeda
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1987 Volume 107 Issue 10 Pages 964

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