Simulation of Near Field Optical Scanning Microscope

Abstract

We constructed the simulation code of two-dimensional Photon Scanning Tunneling Microscope (2D-PSTM) based on integral equations called Guided-Mode Extracted Integral Equations. The code can treat the global-model of 2D-PSTM with a dielectric-probe and with a metal-coated dielectric-probe. Examples of simulations are shown for the case where the object is dielectric and metal. The simulation results shows that the interaction between the object and the probe is very complicated and that it is not easy to understand the physical process of 2D-PSTM intuitively.