Dependence of Dielectric Breakdown of Thin Poly (Vinylidene Fluoride) Film, on Temperature and Thickness

The transactions of the Institute of Electrical Engineers of Japan.A

Online ISSN : 1347-5533
Print ISSN : 0385-4205

Dependence of Dielectric Breakdown of Thin Poly (Vinylidene Fluoride) Film, on Temperature and Thickness

Dae Hee Park, Katsumi Yoshino, Katsumi Okuyama, Syouji Ichihara

Author information

JOURNAL FREE ACCESS

1989 Volume 109 Issue 1 Pages 24-28

DOI https://doi.org/10.1541/ieejfms1972.109.24

Details

Article 1st page

Content from these authors

© The Institute of Electrical Engineers of Japan

Favorites & Alerts

Related articles

Recently viewed articles

Predecessor

The Journal of the Institute of Electrical Engineers of Japan

Successor

IEEJ Transactions on Sensors and Micromachines

IEEJ Transactions on Industry Applications

IEEJ Transactions on Fundamentals and Materials

Top