The transactions of the Institute of Electrical Engineers of Japan.A

The transactions of the Institute of Electrical Engineers of Japan.A

Published by The Institute of Electrical Engineers of Japan

1,608 registered articles
(updated on July 27, 2024)

Online ISSN : 1347-5533
Print ISSN : 0385-4205

JOURNAL FREE ACCESS
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1989 Volume 109 Issue 12

The Change of the Electron Attachment Coefficient Caused by Corona Discharge in Oxygen Shogo Kajita, Sumio Ushiroda, Yoshitaka Kondo
[title in Japanese] [in Japanese], [in Japanese], [in Japanese]
Fundamental Operational Characteristics of a Microwave- Heating-Type Plasmajet Using a Resonant Cavity for Space Propulsion Hirokazu Tahara, Yoshimasa Tanaka, Masao Abuku, Toshiaki Yasui, Ken-ichi Onoe, Takao Yoshikawa
On The Estimation of Dielectric Breakdown Voltage When Breakdown Voltage Follows the 3 Parameter Weibull Distribu-tion Hideo Hirose

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Most viewed articles (June 2024)

1

Multi-stage Impulse Voltage Generator with Triggered Vacuum Switch

Released on J-STAGE: June 30, 2008 | Volume 105 Issue 9 Pages 503-509

Koichi Itagaki, Hiroshi Kitamura
2

The Effect of Electrode Temperature on Spark Brearkdown Voltage

Released on J-STAGE: June 30, 2008 | Volume 92 Issue 9 Pages 423-430

Y. MUROOKA, K. R. Hearne
3

Electrical Characteristics of Gold and Platinum-diffused Power Silicon Devices

Released on J-STAGE: June 30, 2008 | Volume 99 Issue 2 Pages 65-72

Takeo Matsuzawa
4

Construction of Quantum Mechanics for Photon, and Relation with Maxwell Equation

Released on J-STAGE: June 30, 2008 | Volume 109 Issue 2 Pages 49-55

Shigeru Sasabe, Toshimi Adachi
5

The Equations for the Measurements of Dielectric Constant and Dissipation Factor by a Parallel Plate Electrode System

Released on J-STAGE: June 30, 2008 | Volume 99 Issue 12 Pages 585-591

Akira Kakimota, Ichizo Ogawa, Tatsuro Matsushita, Jun Fujita

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Predecessor

The Journal of the Institute of Electrical Engineers of Japan

Successor

IEEJ Transactions on Sensors and Micromachines

IEEJ Transactions on Industry Applications

IEEJ Transactions on Fundamentals and Materials

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