A New Equivalent Circuit to Explane the Time Dependence of the Artificial Void for the Corona Resistance Measurement

The transactions of the Institute of Electrical Engineers of Japan.A

Online ISSN : 1347-5533
Print ISSN : 0385-4205

A New Equivalent Circuit to Explane the Time Dependence of the Artificial Void for the Corona Resistance Measurement

T. ITO, T. SAKAI, Y. TORIYAMA

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1975 Volume 95 Issue 8 Pages 335-340

DOI https://doi.org/10.1541/ieejfms1972.95.335

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