抄録
A method to detect MURA, which is defined as irregular lightness variation on uniformly manufactured surface, is necessary to keep quality of the display devices. The MURA is inevitable matter for devices relating to image processing. Input devices, output devices and display devices have MURA of various levels which determine acceptance of device quality. We report the level of the contrast and resolution which is required to the MURA detection, through MURA detection of shadow masks as an example.
