抄録
Undulating wear of overhead rigid conductor line causes serious trouble, such as extreme wear of contact lines and contact strips of pantograph. This paper describes the mechanism of the undulating wear based on the results of unevenness measurement of real lines and excitation tests of pantograph. It is confirmed that small unevenness is initially formed by contact force fluctuation of pantograph; its amplitude increases only if its wavelength is equal to one of the wavelengths that can cause undulating wear, and finally the unevenness grows rapidly by contact loss arcs.
