The Journal of The Institute of Electrical Engineers of Japan
Online ISSN : 1881-4190
Print ISSN : 1340-5551
ISSN-L : 1340-5551
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Electron Microscope
—History and Latest Technology—
Shinji YAMAMOTOKyohei UMEMOTOKen-ichir YAMASHITA
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Keywords: TEM, SEM
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2013 Volume 133 Issue 5 Pages 298-301

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© 2013 The Institute of Electrical Engineers of Japan
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