The Journal of The Institute of Electrical Engineers of Japan
Online ISSN : 1881-4190
Print ISSN : 1340-5551
ISSN-L : 1340-5551
SPECIAL ISSUE on Development of Scanning Probe Microscopy Techniques and It's Applications
High-speed Atomic-resolution imaging in Liquid by Atomic Force Microscopy
Takeshi FUKUMA
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2014 Volume 134 Issue 12 Pages 820-823

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[in Japanese]

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© 2014 The Institute of Electrical Engineers of Japan
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