The Journal of The Institute of Electrical Engineers of Japan
Online ISSN : 1881-4190
Print ISSN : 1340-5551
ISSN-L : 1340-5551
SPECIAL ISSUE on Crystal Engineering for Power Semiconductor Devices —Si, SiC, GaN, Diamond, Gallium Oxide—
Impact of the AlN Nucleation Layer on GaN grown on Silicon Substrate by MOCVD for Power—devices
Koh MATSUMOTOYuya YAMAOKA
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2017 Volume 137 Issue 10 Pages 681-684

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[in Japanese]
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© 2017 The Institute of Electrical Engineers of Japan
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