The Journal of the Institute of Electrical Engineers of Japan
Online ISSN : 2187-6797
Print ISSN : 0020-2878
ISSN-L : 0020-2878
Study of Emission Microscope Using Electrons Ejected by Ion Bombardment
M. KOJIMAS. MARUSE
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1965 Volume 85 Issue 924 Pages 1567-1575

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© The Institute of Electrical Engineers of Japan
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