The Journal of the Institute of Electrical Engineers of Japan
Online ISSN : 2187-6797
Print ISSN : 0020-2878
ISSN-L : 0020-2878
Dielectric Breakdown Properties of Evaporated SiO Films
Y. INAGAKI, N. TSUCHIDA, S. NITTA
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1969 Volume 89 Issue 972 Pages 1808-1815

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