IEEJ Transactions on Power and Energy
Online ISSN : 1348-8147
Print ISSN : 0385-4213
ISSN-L : 0385-4213
Erratum to : Micro-Analytical Method of Submicron Insulation Morphology near the Semiconducting Interface in an XLPE Cable to Evaluate its Dielectric Properties
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1992 Volume 112 Issue 11 Pages 1048

[Original Article] IEEJ Trans.PE Vol.112 No.10 (1992) pp.863-871
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The transactions of the Institute of Electrical Engineers of Japan.B

The Journal of the Institute of Electrical Engineers of Japan

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