Fundamental and Application of Surface Analysis (II)

Abstract

We summarized important points when metallic cross-sectional microstructure were observed by optical microscope and scanning electron microscope. Quality of a metallic cross-sectional microstructure depended on a specimen production process for observation. It was needed that a specimen for observation by an optical microscope and a scanning electron microscope was produced according to final observation results.

And type of the optical microscope and operating procedures influenced observation results strongly. In that case of the scanning electron microscope, location relationship between a metallic cross-sectional microstructure and electron scanning line position was very important. And we must make full use of a secondary electron image and a back scattered electron image in that case of scanning electron microscope.