2019 Volume 58 Issue 1 Pages 33-40
In-situ measurements of the charge on simulated fogging toner particles were carried out using MEMS-based actuated tweezers and an AFM cantilever. Because this technique enables picking up a single particle and measuring its charge successively, it has great potential for application to the analysis of abnormal toners, such as those in fogging, i. e. single isolated toner particles. The simulated fogging toner particles were deposited on a flat ITO substrate under several voltage conditions, and the amount of charge on these particles was measured. The relationship between the charge and the applied voltage was analyzed. The amount of toner on the ITO substrate was quantified using image analysis to investigate the relationship with the charge on the toner particles. The results demonstrate that, for the evaluation of negative-charging toners, the amount of toner on the ITO substrate decreases as the charge on the toner becomes more positive.