PROCEEDINGS OF THE ITE ANNUAL CONVENTION
Online ISSN : 2424-2292
Print ISSN : 1343-1846
ISSN-L : 1343-1846
1997
Conference information

Name : 1997 ITE Annual Convention

Location : [in Japanese]

Date : July 23, 1997 - July 25, 1997

Optical Simulation for Image Sensors by Wave Analysis
Hideki Mutoh
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 23-24

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Abstract
A wave analysis optics simulator TOCCATA-Wave was developed. It can analyze optical characteristics of image sensors, including diffraction and interference phenomena. The focus conditions of micro-lens with different radius and aperture size and smear characteristics of a IT-CCD were studied by this method.
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© 1997 The Institute of Image Information and Television Engineers
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