Name : 2001 ITE Annual Convention
Location : [in Japanese]
Date : August 27, 2001 - August 29, 2001
In order to reduce raster moire fringes appearing on color CRTs, we investigated electron beam profile. The contrast of the combined moire patterns of modes (1,1) and (2,2) is found to be proportional to the spectral intensity 2/S, of the beam profile, where S is the scan line pitch. Therefore moire fringes can be made less visible by selecting a beam profile which has weaker spectral intensity at 2/S.