PROCEEDINGS OF THE ITE ANNUAL CONVENTION
Online ISSN : 2424-2292
Print ISSN : 1343-1846
ISSN-L : 1343-1846
2001
Session ID : 10-5
Conference information

Name : 2001 ITE Annual Convention

Location : [in Japanese]

Date : August 27, 2001 - August 29, 2001

10-5 Thin Film Analysis of Protecting Materials (MgAl_2O_4) for ac-PDPs with AES, XPS
S. Goto, T. Hirakawa, H. Uchiike, S. Zhang
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Download PDF (325K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Abstract

MgAl_2O_4 is expected as a suitable protecting material for Transmissive and Reflective Phosphor Type ac-Plasma Displays, because MgAl_2O_4 has transmissive property for ultra violet rays. We analyzed thin film MgAl_2O_4 and MgO by using AES and XPS. AES analysis clarifies oxygen defects in the vacuum evaporated thin films of MgO and MgAl_2O_4. XPS analysis shows the difference in the peak of Mg2p between MgAl_2O_4 and MgO.

Content from these authors
© 2001 The Institute of Image Information and Television Engineers
Previous article Next article
Favorites & Alerts

Recently viewed articles
Predecessor

Proceedings of The ITE National Convention

Proceedings of The ITE Annual Convention

Share this page
feedback
 Top