会議名: 2005年映像情報メディア学会年次大会
開催地: 東京理科大学(神楽坂キャンパス)
開催日: 2005/08/24 - 2005/08/26
A column-parallel double-integration-type A/D converter(ADC) for CMOS image sensors is presented. This ADC simultaneously reduces the random noise of readout circuitry and the quantization noise of the ADC. Simulation results show that the resolution of the ADC can be improved by a factor of 5 bits using 1024 times integration.