会議名: 2009年映像情報メディア学会年次大会
開催地: 工学院大学(新宿キャンパス)
開催日: 2009/08/26 - 2009/08/28
This paper describes noise reuction effects of column-parallel correlated multiple sampling (CMS) circuits for CMOS image sensors. The measurement results of an 1M-pixel CMOS image sensor show that the CMS reduces efficiently not only thermal noise but also RTS noise. Very low noise level of 1.8 electrons is attained for sampling number of 16.