2012
Session ID : 15-2
Conference information
Name : 2012 ITE Annual Convention
Location : [in Japanese]
Date : August 29, 2012 - August 31, 2012
15-2 Dependence of oxide TFT characteristics on semiconductor thickness
Mitsuru NAKATA, Hiroshi TSUJI, Hiroto SATO, Yoshiki NAKAJIMA, Yoshihide FUJISAKI, Tatsuya TAKEI, Toshihiro YAMAMOTO, Hideo FUJIKAKE
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