2017
Conference information
Host: The Institute of Image Information and Television Engineers
Name : THE 2017 ITE ANNUAL CONVENTION
Location : [in Japanese]
Date : August 30, 2017 - September 01, 2017
Noise evaluation of an implantable needle type CMOS image sensor with an on-chip ADC
*Koki FUJIMOTO, Kiyotaka SASAGAWA, Yasumi OHTA, Makito HARUTA, Toshihiko NODA, Takashi TOKUDA, Jun OHTA
Author information
Pages 33A-2-
Details
