Abstract
Correlation between laser pulse wave form and recorded mark shape in mark edge recording on a phase change optical disk has been studied using heat transfer simulation and transmission electron microscopy. The mark shape corresponds to distribution of holding time at cryatalization temperature during laser pulse irradiation on the recording film. Relationships between the wave form and the mark shape or crystal grain size around the mark are explaned by analyzing the mark recording process. Control of holding time at transition temperature region between melting point and crystalization temperature by the wave form is important for reducing erase residue.
