ITE Technical Report
Online ISSN : 2424-1970
Print ISSN : 1342-6893
ISSN-L : 1342-6893
22.37
Conference information
Measurement of secondary electron emission coefficient (γ) of protection layer materials in PDPs by using ionization technique with laser
Tomoko SuzukiAkira KanekoYoshio WatanabeNobuaki Furuya
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Pages 19-24

Details
Abstract
For improving the efficiency and the ignition voltage for AC-PDPs, it is important to use high γ value materials as the protection layer. We have developed the novel measurement technique of the secondary electron emission coefficient by using Xe gas breakdown with (CO_2 laser. With this technique, the γ values of the MgO films formed with various evaporation conditions were measured. Also, the quality of the films was estimated with SEM and XRD.
Content from these authors
© 1998 The Institute of Image Information and Television Engineers
Previous article Next article
feedback
Top