Abstract
Conduction mechanism is necessary so that Y_2O_3 which is an insulator may work as a cathode of DC-PDP. In order to clarify the mechanism thin film Y_2O_3/Al structure cathodes are examined. As the result, it seemed to prove the fact next. Many cracks are formed in Y_2O_3 by the high-temperature process. From the crack, Al cathode bus line is sputtered in aging. The Y_2O_3 surface is covered thinly with this Al and a conduction path is formed. In the meantime, the crack causes the sputter of the cathode bus line, and it becomes a short life. When Ni is used as a cathode bus line there are the smaller cracks in Y_2O_3 films and the cathode has a longer life than Al.
