ITE Technical Report
Online ISSN : 2424-1970
Print ISSN : 1342-6893
ISSN-L : 1342-6893
23.56
Session ID : ROFT99-89
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Analysis of optical near-field in tapered fiber probe using beam propagation method
Toyohiro KayanumaYasumitsu Miyazaki
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Abstract

Near-field microprobe and optical microscope is a new type of measurement and microscope using evanescent field. Observation of materials with high resolution below optical wave length. In near-field probe and optical microscope, power of scattered light is neasured by scattering evanescent light on the material using tapered probe. Then the surface of the material is characterized from the relation between power and the position of the probe. Relation depends on the diameter of the top end of the probe. So the probe is one of most important parts in near-field optical measurement and microscope. This is a study on light propagation of near-field probe. We used Beam Propagation Method(BPM)to simulate the propagation. By successfully making a program for BPM, we could find out the basic characteristics of optical propagation in prove.

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© 1999 The Institute of Image Information and Television Engineers
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