ITE Technical Report
Online ISSN : 2424-1970
Print ISSN : 1342-6893
ISSN-L : 1342-6893
24.52
Session ID : IPU2000-58
Conference information
Quantitative Characterization of Substrate Noise for Physical Design Guides in Digital Circuits
Makoto NagataJin NagaiTakashi MorieAtsushi Iwata
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract

Substrate noise is quantitatively evaluated by gain calibrated substrate voltage measurements in a 100 ps-100 μV resolution. Activity in a digital block is a key amount to which the noise intensity is proportional, and its reduction is a straight and universal solution to suppress the noise. Use of Kelvin grounding in the source circuits and placing a guardband proximate to the receiver circuits together also attenuates the noise significantly, however, the effect is limited to the low frequency components such as a ringing.

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© 2000 The Institute of Image Information and Television Engineers
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