Time Dependency of Ion-induced Secondary Electron Emission from Insulator

Abstract

Ion-induced secondary electron emission characteristics is one of the most important factors to evaluate protecting materials for ac-Plasma Displays. In the present paper we measured values of γ_1 of thin-films which are evaporated from source of sintered MgO by using automatic measuring system. The measured results are reproducible and reliable. In consequence, it is clarified that the value of γ_1 changed as the irradiation time of ion beam proceeds, and the thin- film made of sintered MgO has large value of γ i as same as that of crystalline MgO.