Feasibility Study on EMI Measurement "furoshiki" using 2V Organic CMOS and Silicon CMOS

Abstract

Electromagnetic interference (EMI) that degrades the dependability of electronic devices is becoming a serious issue. To realize a measurement of EMI distribution on the surface of electronic devices, a stretchable 12×12cm^2 EMI measurement sheet was developed. This paper reports a feasibility study on the EMI measurement "furoshiki" using both a 2V Organic CMOS technology and a 0.18μm silicon CMOS.