Precise Measurement Method of LC material Parameters

Abstract

A highly precise measurement method of material parameters of liquid crystal (LC) about the electro-optical property was discussed. On C-V (Capacitance-Voltage) fitting method, which measures elastic constants (K_<11>, K_<33>) and dielectric permittivity (ε_‖, ε_⊥) of LC, the optimization for a voltage driving scheme of LC in the capacitance measurement using LCR meter was experimentally analyzed. And a new compensation method for the capacitance of alignment layer and the treatment method of anchoring strength in LC cell, whose effects were ignored in the conventional measurement method, were proposed. We obtained reliable measurement values using our novel C-V fitting method on the C-V property of LC layer.