ITE Technical Report
Online ISSN : 2424-1970
Print ISSN : 1342-6893
ISSN-L : 1342-6893
35.17
Session ID : IST2011-14/CE2011-20
Conference information
A 300mm Wafer-size CMOS Image Sensor
Yasuhiro OguroHidekazu TakahashiYuichiro YamashitaShin KikuchiMasato FujitaSatoshi HirayamaTaikan KanoSakae HashimotoGenzo MommaShunsuke Inoue
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Abstract
A 202×205mm^2, CMOS image sensor is fabricated on 300mm wafer in 0.25μm 1P3M CMOS process. This sensor has 1.6M pixels, a programmable in pixel voltage amplifier, a differential readout circuitry on the column signal path. As a result, this sensor enables the low-noise and high sensitivity. In this paper, we describe the specifications and performance of the wafer-size CMOS image sensor.
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© 2011 The Institute of Image Information and Television Engineers
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