Near-Infrared Spectroscopy Using CMOS Time-Resolved Image Sensors

Abstract

We have been developing a time-resolved image sensor with lock-in pixels which uses a lateral electric field charge modulator (LEFM) for high speed modulation. This image sensor can measure the time response of the Nano second order of the repetitive phenomenon by the resolution of tens of pico seconds. In the paper is applied to the time-resolved NIRS (near-infrared spectroscopy) measurement the time-resolved image sensor. The time-resolved NIRS measurement is reported for the fundamental testing of the time-resolved image sensor.