A CMOS lock-in pixel image sensor with embedded storage diodes and lateral electric field modulation (LEFM) of photo-generated charge is developed for time-resolved measurements such as a fluorescence lifetime imaging microscopy (FLIM) and a near-infrared spectroscopy (NIRS). The developed time-resolved imager achieves a very high time-resolution of 10 ps and a short intrinsic response time of 180 ps at 374 nm, and a low random noise of 1.75 e^-_<rms> with true correlated double sampling (CDS) operation.