CMOS pixel aperture structure for extracting depth information

Byoung-Soo Choi; Myunghan Bae; Sang-Hwan Kim; Seunghyuk Chang; JongHo Park; Sang-Jin Lee; Jang-Kyoo Shin

doi:10.11485/itetr.40.40.0_35

40.40 Information Sensing Technologies(IST)

Session ID : IST2016-65

DOI https://doi.org/10.11485/itetr.40.40.0_35

Conference information

Host: Information Sensing Technologies(IST)

Name : Information Sensing Technologies(IST)

Date : November 17, 2016

CMOS pixel aperture structure for extracting depth information

*Byoung-Soo Choi, Myunghan Bae, Sang-Hwan Kim, Seunghyuk Chang, JongHo Park, Sang-Jin Lee, Jang-Kyoo Shin

Author information

Keywords: CMOS, pixel structure, aperture, depth information, 3D imaging

CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract

Complementary metal-oxide-semiconductor (CMOS) pixel aperture structure for extracting depth information is presented. The proposed structure uses RGBW pixel patterns and the aperture is located in the white pixel. The focused image is obtained by white pixels and the defocused image by RGB pixels. Both the focused image and the defocused image can be used to obtain depth information of the object.

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