THE 53RD JAPAN JOINT AUTOMATIC CONTROL CONFERENCE
Session ID : 647
Conference information
Host: The Japan Society of Mechanical Engineers, The Society of Instrument and Control Engineers, The Institute of Systems, Control and Information Engineers, The Society of Chemical Engineers, Japan, The Japan Society for Precision Engineering, The Japan Society for Aeronautical and Space Sciences
Co-host: Technically Cosponsored by 50 Societies and Institutes
Signal Processing and Pattern Recognition
Scan Matching using Genetic Algorithm for Three Dimensional Mapping
Details
