Earozoru Kenkyu
Online ISSN : 1881-543X
Print ISSN : 0912-2834
ISSN-L : 0912-2834
Feature Articles -Science of Functional Plasma and Its Advanced Application Technology-
Particle Behavior and Control Method of Particulate Contamination in Plasma CVD Process
Yutaka HAYASHIManabu SHIMADA
Author information
JOURNAL FREE ACCESS

2006 Volume 21 Issue 3 Pages 209-214

Details
Abstract
The application of plasma processing technologies to the engineering and industrial fields is expanding. Fine particles suspended in plasma, often called plasma dust, are known to be a major factor of disturbing the manufacturing processes of electronic devices, etc. Therefore, studies on the formation and behavior of fine particles in plasma are important from the viewpoint of developing methods to control plasma dust. In this article, recent studies are introduced on the observation and discussion for dust in a plasma CVD reactor using a particle visualization technique based on laser light scattering, and on the methods for suppressing particulate contamination by plasma dust.
Content from these authors
© 2006 Japan Association of Aerosol Science and Technology
Previous article Next article
feedback
Top