日本マイクログラビティ応用学会誌
Print ISSN : 0915-3616
半導体結晶成長における第 2 種不純物縞の形成とその抑制法
西永 頌ベンツ K W・ダニレウスキ- A.N.岡本 裕介
著者情報
ジャーナル オープンアクセス

1992 年 9 巻 2 号 p. 43-

詳細
抄録
The formation and the suppression of type II striation in compound semiconductors grown by travelling heater method (THM) are studied. The work was done by an international cooperation between Germany and Japan supported by Science and Technology Agency of Japan. GaSb and InP crystals grown by SL-1 and D-1 missions and on ground by German group are studied with differential interference microscope and specially resolved photoluminescence spectrometer. By comparing theory and experiment, it is concluded that the suppression of type II striation is possible by applying a temperature gradient and keeping the growth velocity lower than a certain value.
著者関連情報
© 1992 日本マイクログラビティ応用学会
前の記事 次の記事
feedback
Top