JOURNAL OF CHEMICAL ENGINEERING OF JAPAN
Online ISSN : 1881-1299
Print ISSN : 0021-9592
Effect of a Radiation Shield on Thermal Stress Field during Czochralski Crystal Growth of Silicon
Takao TsukadaMitsunori HozawaNobuyuki Imaishi
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1990 年 23 巻 2 号 p. 186-191

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抄録
For silicon CZ crystal growth, the effect of a radiation shield inserted in a furnace on the thermal stress field was studied theoretically by the finite-element method based on thermoelastic analysis.
It is found that a radiation shield lowers the maximum (thermally induced) shear stress, since it reduces the temperature gradient, especially in the radial direction, in a crystal. There is an optimum location for placement of the radiation shield so as to realize the smallest shear stress. From the viewpoint of thermal stress, a radiation shield can allow a higher pull rate of defect-free crystal.
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© 1990 The Society of Chemical Engineers, Japan
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