Abstract
This paper describes a novel method for joining aluminum and silicon nitride using a polysiloxane. The X-ray diffraction patterns suggested that the polysiloxane surrounded by aluminum and silicon nitride powders could be transformed into silicon, aluminum silicate, and SiAlON. Neither cracks nor exfoliation between aluminum and silicon nitride could be observed, and they were joined through the joining layer. Moreover, detailed investigation of the layer by transmission electronic microscopy, selected area electron diffraction, and point analysis energy-dispersive X-ray spectroscopy suggested that the layer consisted of amorphous and nano-sized polycrystalline particles containing aluminum, silicon, nitrogen, and oxygen. The minimum thickness of the layer was less than 10 nm. The bending strength of the joined sample was 204 MPa and the fracture point was the joining layer between aluminum and silicon nitride.
