高分解能TEMとX線回折シミュレーションによって明らかにされる層状ケイ酸塩鉱物中の積層不整

抄録

Stacking disorder is a common phenomenon in phyllosilicates but difficult to be understood using conventional diffraction techniques. In contrast, recent investigations using high-resolution transmission electron microscopy (HRTEM) have elucidated the nature of stacking disorder in various phyllosilicates, by directly observing individual layers and stacking sequences. Furthermore, simulations of X-ray or electron diffraction patterns using the information from the HRTEM results can complement the limited analysis area in TEM and quantify the degree of the stacking disorder. In this review, several examples of such analyses to reveal the stacking disorder in natural phyllosilicates are described.