最近の研究から
収差補正透過電子顕微鏡による単分子・単原子の観察
2011 年 53 巻 4 号 p. 280-284
詳細
2011 年 53 巻 4 号 p. 280-284
Spherical aberration correctors recently developed for transmission electron microscopes (TEM) and scanning TEM (STEM) have enabled direct imaging of single molecules and atoms at low electron acceleration voltages. Here, we review some recent studies on carbon nanotubes (CNTs) and fullerene nanopeapods using aberration-corrected TEM/STEM operated at 120 kV or lower voltages. Local structures of individual CNTs are visualized in details including various defects such as atomic vacancies and so-called Stone-Wales defects. Atomic-level structures of fullerene molecules inside CNTs are unambiguously visualized. Single atoms of lanthanides and calcium in nanopeapods are identified by using STEM-EELS operated at 60 kV.
