抄録
After a short history of X-ray diffraction topography, from the early stage of laboratory X-ray topography to recent synchrotron-radiation applications, is described, the development of science and technology for the synchrotron X-ray topography and its industrial applications are reviewed in more detail. In addition, the recent trend of synchrotron topography research is clarified on the basis of several data obtained from 256 papers which have been published since 2000.
